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February 14, 2019 | 12:00 p.m. - 1:00 p.m.
Category: Seminar
Location: State Hall #224 | Map
5143 Cass
Detroit, MI 48202
Cost: Free
Audience: Academic Staff, Alumni, Community, Current Graduate Students, Current Undergraduate Students, Faculty, Parents, Prospective Students

Behind the Test Challenges of Smart Video Cameras and Sensors for Autonomous Vehicles

Abstract:AI powered smart automotive video cameras and sensors increasingly gain importance by enabling self-driving vehicles to better perceive their surroundings, will challenge test engineers at the component and system level.   Modern cameras and sensors generate large amounts of raw data that require new and innovative approach to multi-channel capturing, timestamping, annotating and recording using standard formats to enable access to third-party's HIL/SIL platforms. Using a configurable open hardware platform approach enables flexibility and future proofing of systems for test engineers to adjust to changing system requirements.

Challenges: large data throughput from up to 12 Megapixel, in addition to Lidars, Radars and vehicle networks, that need to be synchronized with a universal timestamp for system validation and Hardware in the Loop testing.

Bio:Sam has more than 30 years of Semiconductor, Systems and Software experience in Sales, Marketing, Business Development, Applications and Design in industry servicing Fortune 500 companies.  He has been a senior executive with major semiconductor suppliers like Samsung, Toshiba, Silicon Labs, Atmel, and several startups.  Has held executive level positions in business development, marketing and sales  with global companies in and traveled extensively in the US, Canada, China, Europe, Japan, South Korea, Taiwan, Singapore, India and Mexico. 

 

For more information about this event, please contact LaNita Stewart at 313-577-2478 or LStewart@wayne.edu.